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SIAM Journal on Imaging Sciences

Editorial Board


Editorial Board

Editor-in-Chief

Michael Elad
Technion - Israel Institute of Technology
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Associate Editors

Habib Ammari
ETH Zurich
Jean-Francois Aujol
Universite Bordeaux I
Richard G. Baraniuk
Rice University
Jose M. Bioucas-Dias
Instituto Superior Tecnico
Charles A. Bouman
Purdue University
David J. Brady
Duke University
Xavier Bresson
Nanyang Technological University
Alexander Bronstein
Technion - Israel Institute of Technology
Michael M. Bronstein
Universita Della Svizzera Italiana
Mujdat Cetin
University of Rochester
Antonin Chambolle
Ecole Polytechnique
Subhasis Chaudhuri
Indian Institute of Technology Bombay
Frederic Chazal
INRIA Saclay Ile-de-France - SAF
Patrick L. Combettes
North Carolina State University
Weisheng Dong
Xidian University
Kjersti Engan
University of Stavanger
Jalal Fadili
CNRS and ENS Lyon
Adel Faridani
Oregon State University
Sina Farsiu
Duke University
Jeff Fessler
University of Michigan
Mario Figueiredo
Instituto de Telecomunicacoes (IT)
Alessandro Foi
Tampere University of Technology
Markus Haltmeier
University of Innsbruck
Peter Kuchment
Texas A&M University
Gitta Kutyniok
Technische Universitaet Berlin
Qing H. Liu
Duke University
Deanna Needell
University of California, Los Angeles
Michael Ng
Hong Kong Baptist University
Mads Nielsen
University of Copenhagen
Gabriel Peyré
Universite De Paris-Dauphine
Thomas Pock
Technische Universitaet Graz
Otmar Scherzer
University of Vienna
Christoph Schnoerr
University of Heidelberg
Carola-Bibiane Schoenlieb
DAMTP, University of Cambridge
Ivan W. Selesnick
Polytechnic University
Gabriele Steidl
Kaiserslautern University
Thomas Strohmer
University of California, Davis
Xue Cheng Tai
Hong Kong Baptist University
Chrysoula Tsogka
University of Crete
Dimitri Van De Ville
Ecole Polytechnique Federale De Lausanne
René Vidal
Johns Hopkins University
Joachim Weickert
Saarland University
Brendt Wohlberg
Los Alamos National Laboratory
Lei Zhang
Hong Kong Polytechnic University

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